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Title Aberration-corrected analytical transmission electron microscopy [electronic resource] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks.

Published Hoboken, N.J. : Wiley, 2011.


Location Call No. Status
Physical description xv, 280 p., [8] leaves of plates : ill. (some col.)
Bibliography Includes bibliographical references and index.
Summary "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- Provided by publisher.
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Provided by publisher.
Reproduction Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Other author Brydson, Rik.
Brooks, Susan.
Royal Microscopical Society (Great Britain)
ProQuest (Firm)
Subject Transmission electron microscopy.
Electronic books.
ISBN 9780470518519 (hardback)
9781119978855 (e-book)