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PRINTED BOOKS
Author Peng, L.-M.

Title High-energy electron diffraction and microscopy / L.-M. Peng, S.L. Dudarev, M.J. Whelan.

Published Oxford : Oxford University Press, 2004.

Copies

Location Call No. Status
 UniM ERC  530.41 PENG    AVAILABLE
Physical description xxi, 535 pages : illustrations ; 24 cm.
Series Monographs on the physics and chemistry of materials ; 61.
Monographs on the physics and chemistry of materials ; 61.
Bibliography Includes bibliographical references and index.
Contents 1.2 Interaction between high-energy electrons and a solid 2 -- 1.3 Elastic and inelastic scattering, and the complex potential 3 -- 1.4 Amplitude and the differential cross-section of scattering of electrons 4 -- 1.5 Elastic scattering by a time-independent potential--the one-body Schrodinger equation 6 -- 1.6 Selected area electron diffraction (SAED), convergentbeam electron diffraction (CBED), and Kikuchi patterns 8 -- 1.7 Scattering by time-dependent fluctuations of the potential 11 -- 1.8 Damping of coherence in inelastic scattering and the validity of the optical potential 14 -- 1.9 Relativistic corrections 17 -- 1.10 Probability current density and conservation of probability 18 -- 1.11 Correlation between theory and experiment 19 -- 2 Kinematic theory 24 -- 2.2 Kinematic and quasi-kinematic diffraction theory 25 -- 2.3 Scattering by a single atom 27 -- 2.4 Amplitude of scattering by an assemblage of atoms 33 -- 2.5 Diffraction by single crystals 36 -- 2.6 Diffraction by a gas, an amorphous solid, and a liquid 42 -- 2.7 Diffraction by polycrystals and textures 45 -- 2.8 Fluctuation microscopy 48 -- 3 Dynamical theory I. General theory 54 -- 3.2 Role of symmetry in dynamical diffraction 55 -- 3.3 Forward and backward scattering 59 -- 3.4 Multislice method 60 -- 3.5 General matrix method 63 -- 4 Dynamical theory II. Transmission high-energy electron diffraction 75 -- 4.2 Diffraction geometry 75 -- 4.3 Basic concepts and the treatment of ZOLZ diffraction 79 -- 4.4 General treatment of THEED and HOLZ diffraction 98 -- 5 Dynamical theory III. Reflection high-energy electron diffraction 117 -- 5.2 Surface structure notation and RHEED geometry 118 -- 5.3 RHEED theory 123 -- 5.5 RHEED from growing surfaces: intensity oscillations 175 -- 6 Resonance effects in transmission and reflection high-energy electron diffraction 186 -- 6.1 Origin of resonances 186 -- 6.2 Transmission resonance diffraction of high-energy electrons 187 -- 6.3 Resonance diffraction from a crystal surface 200 -- 7 Diffuse and inelastic scattering--Elementary processes 228 -- 7.1 Diffuse and inelastic scattering 228 -- 7.2 Distorted wave Born approximation 230 -- 7.3 Diffuse scattering by point defects 235 -- 7.4 Van Hove dynamic form factor 241 -- 7.5 Thermal diffuse scattering 246 -- 7.6 Electron energy losses 251 -- 8 Diffuse and inelastic scattering--Multiple scattering effects 264 -- 8.2 Breakdown of the DWBA and the optical potential model 266 -- 8.3 Diffraction and multiple incoherent scattering of electrons 268 -- 8.4 Kinetic equation for the density matrix 269 -- 8.5 Loss of coherence due to multiple scattering by plasmons 274 -- 8.6 Diffraction of diffusely scattered electrons: the formation of Kikuchi lines and bands 282 -- 8.7 Kikuchi patterns in electron backscattering 287 -- 8.8 Multiple diffuse scattering: an exact solution of the backscattering problem 290 -- 8.9 Electron channelling patterns and channelling imaging of crystal defects 296 -- 8.10 Diffraction effects in inner-shell ionization, X-ray, and Auger electron production 304 -- 9 Crystal and diffraction symmetry 311 -- 9.2 Representation of symmetry 312 -- 9.3 Reciprocity principle 313 -- 9.4 Symmetry elements and their identification 314 -- 9.5 Diffraction symmetry--a formal derivation 318 -- 9.6 Crystal point group determination 330 -- 9.7 Crystal space group determination 332 -- 9.8 Automated identification of CBED pattern symmetry 337 -- 10 Perturbation methods and tensor theory 350 -- 10.2 Perturbation treatment of a periodic structure 353 -- 10.3 Tensor THEED 358 -- 10.4 Direct inversion of THEED data 362 -- 10.5 Perturbation methods for non-periodic structures 379 -- 10.6 Tensor RHEED and the direct inversion of a surface structure 383 -- 11 Digital electron micrograph recording and basic processing 388 -- 11.2 Basic features of CCDs 389 -- 11.3 A basic model of an SSC camera 390 -- 11.4 Main characteristics of an SSC camera 391 -- 11.5 Sampling theorem 398 -- 11.6 Discrete and fast Fourier transform 399 -- 11.7 Restoration of images 402 -- 12 Image formation and the retrieval of the electron wave function 406 -- 12.2 Electron source and coherence 406 -- 12.3 Image formation in an electron microscope 412 -- 12.4 Exit electron wave function retrieval 418 -- 13 Atomic scattering factor and the optical potential 427 -- 13.2 Optical potential 429 -- 13.3 Averaged potential 432 -- 13.4 Absorptive potential 437 -- 13.5 Computation of the complex structure factor 440 -- 13.6 Analytical representation of atomic scattering factors 443 -- 13.7 Analytical expressions for the optical potential of atoms and crystals 447 -- 14 Temperature-dependent Debye-Waller factors 454 -- 14.2 Debye-Waller factors of elemental crystals 456 -- 14.3 Debye-Waller factors of cubic compounds 458 -- A Some useful mathematical relations 470 -- A.1 Fourier transformation 470 -- A.2 Dirac delta function 470 -- A.3 Kronecker delta symbol 471 -- A.4 Some useful integrals 472 -- B Green's functions 473 -- C FORTRAN listing of RHEED routines 477 -- C.1 A FORTRAN routine for the calculation of U[subscript G](z) 477 -- C.2 A FORTRAN routine for dynamical RHEED calculations 481 -- D Parameterization of the electron atomic scattering factor 490 -- D.1 Parameterization algorithm 490 -- D.2 Absorptive atomic scattering factor 496.
Other author Whelan, M. J.
Dudarev, S. L.
Subject High energy electron diffraction.
Electron microscopy.
ISBN 0198500742 £69.95