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SUBJECTS (1-26 of 26)
Semiconductors -- Defects.
1
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    E-RESOURCE c2009

Charged semiconductor defects structure, thermodynamics and diffusion / [electronic resource] : by Edmund G. Seebauer, Meredith C. Kratzer.

    Seebauer, Edmund Gerard.
London : Springer,        xiv, 294 p. : ill., plans ; 24 cm. c2009
2
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    E-RESOURCE c2009

Charged semiconductor defects structure, thermodynamics and diffusion / [electronic resource] : Edmund G. Seebauer, Meredith C. Kratzer.

    Seebauer, Edmund G. (Edmund Gerard)
London : Springer,        xiv, 294 p. : ill. ; 24 cm. c2009
3
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    PRINTED BOOKS 1992

Deep centers in semiconductors : a state-of-the-art approach / edited by Sokrates T. Pantelides.

   
Yverdon, Switzerland ; Philadelphia, Pa., U.S.A. : Gordon and Breach Science Publishers,    2nd ed.    xv, 928 pages : illustrations ; 24 cm 1992
4
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    PRINTED BOOKS c1998-

Defects and diffusion in semiconductors : an annual retrospective / editor, D.J.Fisher.

   
Ueticon-Zuerich, Switzerland : Scitec Publications ; Enfield, N.H. : Distributed in the Americas by Trans Tech Publications,        volumes : illustrations ; 25 cm. c1998-
5
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    PRINTED BOOKS 2002

Defects and diffusion in semiconductors : an annual retrospective V / editor, D.J. Fisher.

   
Uetikon-Zuerich, Switzerland : Scitec Publications ; Enfield, N.H. : Distributed in the Americas by Trans Tech Publications,        vii, 449 pages : illustrations ; 25 cm. 2002
6
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    E-RESOURCE 2008

Defects and diffusion in semiconductors. XI : an annual retrospective / D.J. Fisher.

   
Stafa-Zuerich, Switzerland : TTP, Trans Tech Publications,        1 online resource (154 pages) : illustrations. 2008
7
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    E-RESOURCE 2011

Defects and diffusion in semiconductors XIII / edited by D.J. Fisher.

   
Durnten-Zurich : Trans Tech Publications Ltd,        1 online resource (172 pages) : illustrations. 2011
8
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    E-RESOURCE 2013

Defects and diffusion in semiconductors. XIV.

   
Durnten-Zurich, Switzerland : Trans Tech Publications,        1 online resource (215 pages) : illustrations. 2013
9
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    E-RESOURCE 2009

Defects and diffusion, theory and simulation : an annual retrospective I / editor, D.J. Fisher.

   
Stafa-Zurich : Trans Tech Publications,        1 online resource (268 pages) : illustrations. 2009
10
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    E-RESOURCE 2010

Defects and diffusion, theory and simulation : an annual retrospective II / editor, D.J. Fisher.

   
Stafa-Zurich ; Enfield, NH : Trans Tech Publications,        1 online resource (190 pages) : illustrations. 2010
11
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    PRINTED BOOKS 2012

Dopants and defects in semiconductors / Matthew D. McCluskey, Eugene E. Haller.

    McCluskey, Matthew D.
Boca Raton, FL : CRC Press,        xx, 370 pages : illustrations ; 26 cm 2012
12
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    E-RESOURCE 2012

Dopants and defects in semiconductors / Matthew D. McCluskey, Eugene E. Haller.

    McCluskey, Matthew D., author.
Boca Raton, Florida ; London, England ; New York, New York : CRC Press,        1 online resource (372 pages) : illustrations 2012
13
 
    PRINTED BOOKS 1968

Doping reactions in lead selenide / by George Bajan Bacskay.

    Bacskay, George Bajan.
[Parkville, Victoria] : University of Melbourne,        iii, 110 leaves, bound : illustrations ; 26 cm 1968
14
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    E-RESOURCE 1996

Early stages of oxygen precipitation in silicon / edited by R. Jones.

   
Dordrecht ; Boston : Kluwer Academic,        1 online resource (xviii, 530 pages) : ill. 1996
16
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    E-RESOURCE c2009

Extended defects in germanium fundamental and technological aspects / [electronic resource] : Cor Claeys, Eddy Simoen.

    Claeys, Cor L.
Berlin : Springer-Verlag,        1 online resource. c2009
17
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    E-RESOURCE 2007

Extended defects in semiconductors electronic properties, device effects and structures / [electronic resource] : D.B. Holt, B.G. Yacobi.

    Holt, D. B.
Cambridge ; New York : Cambridge University Press,        1 online resource (xi, 631 p.) : ill. 2007
18
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    E-RESOURCE c2005

Lifetime spectroscopy a method of defect characterization in silicon for photovoltaic applications / [electronic resource] : S. Rein.

    Rein, S. (Stefan)
Berlin ; New York : Springer,        1 online resource (xxvi, 489 p.) : ill. (some col.) c2005
19
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    E-RESOURCE c2005

Lifetime spectroscopy a method of defect characterization in silicon for photovoltaic applications / [electronic resource] : S. Rein.

    Rein, S. (Stefan)
Berlin ; New York : Springer,        1 online resource (xxvi, 489 p.) : ill. (some col.) c2005
20
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    E-RESOURCE 2004

Microchip fabrication : a practical guide to semiconductor processing / [electronic resource] / Peter Van Zant.

    Van Zant, Peter.
New York : McGraw-Hill,    5th ed.    1 electronic text (xiii, 642 p.) : ill. 2004
21
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    E-RESOURCE c2010

Optical absorption of impurities and defects in semiconducting crystals hydrogen-like centres / [electronic resource] : Bernard Pajot.

    Pajot, Bernard, Dr.
Heidelberg : Springer,        xix, 470 p. : ill. ; 24 cm. c2010
22
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    PRINTED BOOKS 2010

Physical limitations of semiconductor devices / V.A. Vashchenko, V.F. Sinkevitch.

    Vashchenko, V. A.
New York : Springer,        xiii, 330 pages : illustrations ; 24 cm 2010
23
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    E-RESOURCE c2008

Physical limitations of semiconductor devices / [electronic resource] / V.A. Vashchenko and V.F. Sinkevitch.

    Vashchenko, V. A.
New York : Springer,        1 online resource (xiii, 330 p.) : ill. c2008
24
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    PRINTED BOOKS 1990

Physics of DX centers in GaAs alloys / edited by J.C. Bourgoin.

   
Vaduz, Liechtenstein : Sci-Tech Publications,        295 pages : illustrations ; 25 cm. 1990
25
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    PRINTED BOOKS 1983

Point defects in semiconductors / M. Lannoo, J. Bourgoin.

    Lannoo, M. (Michel), 1942-
Berlin ; New York : Springer-Verlag,        2 volumes : illustrations ; 24 cm. 1983
26
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    E-RESOURCE c2007

Theory of defects in semiconductors / [electronic resource] / David A. Drabold, Stefan K. Estreicher (eds.).

   
Berlin ; New York : Springer,        1 online resource (xiii, 295 p.) : ill. c2007
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