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SUBJECTS (1-19 of 19)
Semiconductors -- Defects -- Congresses.
5
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    PRINTED BOOKS 1994

Defect recognition and image processing in semiconductors and devices : proceedings of the fifth international conference, Santander, Spain, 6-10 September 1993 / edited by J. Jiménez.

   
Bristol ; Philadelphia : Institute of Physics Pub.,        xx, 417 pages : illustrations ; 24 cm. 1994
6
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    PRINTED BOOKS 1987

Defects and properties of semiconductors : defect engineering / edited by J. Chikawa, K. Sumino, and K. Wada.

   
Tokyo : KTK Scientific ; Dordrecht ; Boston : D. Reidel ; Norwell, MA, U.S.A. : Distributed in the U.S.A. and Canada by Kluwer Academic,        vi, 261 pages : illustrations ; 24 cm. 1987
7
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    PRINTED BOOKS 1976

Defects and their structure in nonmetallic solids : [proceedings of a NATO Advanced Study Institute held at the University of Exeter, August 24-September 6, 1975] / edited by B. Henderson and A. E. Hughes.

    NATO Advanced Study Institute (1975 : University of Exeter)
New York : Plenum Press,        x, 505 pages : illustrations ; 26 cm. 1976
8
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    E-RESOURCE  

Defects and their structure in nonmetallic solids [proceedings of a NATO Advanced Study Institute held at the University of Exeter, August 24-September 6, 1975] / [electronic resource] : edited by B. Henderson and A.E. Hughes.

    NATO Advanced Study Institute (1975 : University of Exeter)
New York : Plenum Press,        1 online resource (x, 505 pages) : illustrations.  
9
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    E-RESOURCE c2006

Defects in high-k gate dielectric stacks nano-electronic semiconductor devices / [electronic resource] : edited by Evgeni Gusev.

    NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia)
Dordrecht : Springer,        1 online resource (x, 492 p.) : ill. c2006
11
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    E-RESOURCE 2012

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by H

    International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)
Durnten-Zurich ; Enfield, NH : Trans Tech Publications,        1 online resource (300 pages). 2012
12
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    E-RESOURCE 2002-

IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP. / [electronic resource] :

    IEEE International Conference on Advanced Thermal Processing of Semiconductors.
Piscataway, N.J. : IEEE,        Annual 2002-
13
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    PRINTED BOOKS 1991

Physics and chemistry of mercury cadmium telluride and novel IR detector materials, San Francisco, CA, 1990 / editor : David G. Seiler.

    U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride (9th : 1990 : San Francisco, Calif.)
New York : American Institute of Physics,        viii, 1613-1901 : illustrations ; 29 cm. 1991
14
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    PRINTED BOOKS 1989

Point and extended defects in semiconductors / edited by G. Benedek, A. Cavallini, and W. Schröter.

    Workshop on Point, Extended, and Surface Defects in Semiconductors (2nd :, : 1988 : Erice, Italy)
New York : Plenum Press,        x, 287 pages : illustrations ; 26 cm. 1989
15
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    E-RESOURCE 1989

Point and extended defects in semiconductors / edited by G. Benedek, Universitᡠdegli Studi di Milano, Milan, Italy, A. Cavallini, Universitᡠdegli Studi di Bologna, Bologna, Italy, and W. Schr说er, University of G说tingen, G说tingen, Federal Re

    Workshop on Point, Extended, and Surface Defects in Semiconductors (2nd : 1988 : Erice, Italy)
New York : Plenum Press,        1 online resource (x, 287 pages) : illustrations. 1989
16
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    PRINTED BOOKS 1992

Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.

   
New York : American Institute of Physics,        vii, 280 pages : illustrations ; 25 cm. 1992
17
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    PRINTED BOOKS 1998

Stress induced phenomena in metallization : fourth international workshop, Tokyo, Japan, June, 1997 / editors, Hidekazu Okabayashi, Shoso Shingubara, Paul S. Ho.

   
Woodbury, N.Y. : American Institute of Physics,        ix, 519 pages : illustrations ; 25 cm. 1998
18
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    PRINTED BOOKS 1994

Stress-induced Phenomena in Metallization : Second International Workshop, Austin, TX March 1993 / editors: Paul S. Ho, Che-Yu Li, Paul Totta.

    International Workshop on Stress-Induced Phenomena in Metallization (2nd : 1993 : Austin, Tex.)
New York : American Institute of Physics,        vii, 302 pages : illustrations ; 25 cm. 1994
19
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    PRINTED BOOKS 1996

Stress-induced phenomena in metallization : third International Workshop, Palo Alto, CA, June 1995 / editors, Paul S. Ho ... [and others]

    International Workshop on Stress-Induced Phenomena in Metallization (3rd : 1995 : Palo Alto, Calif.)
New York : American Institute of Physics,        vii, 304 pages : illustrations ; 25 cm. 1996
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