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SUBJECTS (1-5 of 5)
Semiconductors -- Failures.
1
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    E-RESOURCE 2005

Data mining and diagnosing IC fails / [electronic resource] / Leendert M. Huisman.

    Huisman, Leendert M.
New York : Springer,        1 online resource (270 p.) : ill. 2005
2
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    E-RESOURCE 2014

Electrical overstress (EOS) devices, circuits and systems / [electronic resource] : Steven H. Voldman.

    Voldman, Steven H.
Chichester, West Sussex, U.K. : John Wiley & Sons Inc.,        xxiv, 344 p. : ill. 2014
3
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    E-RESOURCE 2009

ESD failure mechanisms and models / [electronic resource] : Steven H. Voldman.

    Voldman, Steven H.
Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley,        xxiv, 384 p. 2009
4
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    E-RESOURCE 1992

Theory of CMOS digital circuits and circuit failures / Masakazu Shoji.

    Shoji, Masakazu, 1936- author.
Princeton, New Jersey : Princeton University Press,        1 online resource (589 pages) : illustrations. 1992
5
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    E-RESOURCE 2010

Wire bonding in microelectronics / [electronic resource] / George G. Harmon.

    Harman, George G.
New York : McGraw-Hill,    3rd ed.    1 electronic text (xx, 426 p.) : ill. 2010
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