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Cover Art
E-RESOURCE
Author IEEE Semiconductor Thermal Measurement and Management Symposium.

Title Proceedings [electronic resource] / Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

Published New York, NY : Institute of Electrical and Electronics Engineers, 1991-
Dates of Publication Began with: 7th (1991).

Copies

Location Call No. Status
 UniM INTERNET resource    AVAILABLE
Frequency Annual
Restrictions Use copy Restrictions unspecified MiAaHDL star
Reproduction Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
System notes Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
Issuing body notes Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
Processing Action digitized 2010 HathiTrust Digital Library committed to preserve MiAaHDL pda
Notes Description based on print version record.
Latest issue consulted: 33rd (2017) (IEEExplore viewed Feb. 27, 2018).
Continues IEEE Semiconductor Thermal and Temperature Measurement Symposium. Proceedings
Other author IEEE Components, Hybrids, and Manufacturing Technology Society.
Subject Semiconductors -- Thermal properties -- Congresses.
Semiconductors -- Cooling -- Congresses.
Amorphous semiconductors -- Thermal properties -- Congresses.
Integrated circuits -- Congresses.
Conference papers and proceedings.
Abbreviated title IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM
IEEE SYMPOSIUM SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT
Proceedings (Annu. IEEE Semicond. Therm. Meas. Manag. Symp. Online)
Variant Title IEEE SEMI-THERM Symposium
Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Annual Semiconductor Thermal Measurement and Management Symposium
SEMI-THERM
Semiconductor Thermal Measurement and Management Symposium
ISSN 2577-1000
1065-2221