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Title Atom probe field ion microscopy / M.K. Miller ... [et al.].

Published Oxford : Clarendon Press ; New York : Oxford University Press, 1996.


Location Call No. Status
 UniM Store Engin  502.82 ATOM    AVAILABLE
Physical description xi, 509 p., [4] p. of plates : ill. (some col.) ; 24 cm.
Series Monographs on the physics and chemistry of materials ; 52
Oxford science publications
Bibliography Includes bibliographical references and index.
Contents 1. Historical background and general introduction -- 2. Physical principles of field ion microscopy -- 3. FIM image interpretation and applications -- 4. Physical principles of atom probe instrumentation -- 5. Statistical analysis of atom probe data -- 6. Metallurgical applications -- 7. Atom probe studies of non-metallic materials, thin films and surface phenomena -- App. A. Specimen preparation -- App. B. Acronyms -- App. C. Useful constants and conversion factors -- App. D. Stereographic projections and FIM image simulations -- App. E. Image force model predictions of low-temperature evaporation fields -- App. F. Percentage points of the [actual symbol not reproducible] -- App. G. Table of the integrated normal distribution -- App. H. Periodic table showing commonly occurring charge states -- App. I. Periodic table showing isotope abundances.
Other author Miller, M. K. (Michael Kenneth)
Subject Atom-probe field ion microscopy.
ISBN 0198513879