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E-RESOURCE
Author Kirkland, Earl J.

Title Advanced computing in electron microscopy [electronic resource] / Earl J. Kirkland.

Published New York : Springer, c2010.

Copies

Location Call No. Status
 UniM INTERNET resource    AVAILABLE
Edition 2nd ed.
Physical description 1 online resource (x, 289 p.) : ill.
Bibliography Includes bibliographical references (p. 271-286) and index.
Contents Note continued: 6.3. Bloch Wave Differential Equation Solution -- 6.4. Multislice Solution -- 6.4.1. Formal Operator Solution -- 6.4.2. Finite Difference Solution -- 6.4.3. Free Space Propagation -- 6.5. Multislice Interpretation -- 6.6. Multislice Method and FFT's -- 6.7. Slicing the Specimen -- 6.8. Aliasing and Bandwidth -- 6.9. Interfaces and Defects -- 6.10. Multislice Implementation -- 6.10.1. Propagator Function and Specimen Tilt -- 6.10.2. Convergence Tests -- 6.10.3. Partial Coherence in BF-CTEM -- 6.10.4. Parallel Computing -- 6.11. More Accurate Slice Methods -- 6.11.1. Operator Solutions -- 6.11.2. Finite Difference Solutions -- 7.1. Gallium Arsenide -- 7.1.1. BF-CTEM Simulation -- 7.1.2. ADF-STEM Simulation -- 7.1.3. Channeling -- 7.2. Silicon Nitride -- 7.3. CBED Simulations -- 7.4. Thermal Vibrations of the Atoms in the Specimen -- 7.4.1. Silicon 111 CBED with TDS -- 7.4.2. Silicon 110 ADF-STEM with TDS -- 7.5. Specimen Edges or Interfaces -- 7.6. Biological Specimens -- 7.7. Quantitative Image Matching -- 7.8. Troubleshooting (What Can Go Wrong) -- 8.1. Program Organization -- 8.2. Image Display -- 8.3. Programming Language -- 8.3.1. Disk File Format -- 8.4. BF-CTEM Sample Calculations for Periodic Specimens -- 8.4.1. Atomic Potentials -- 8.4.2. Multislice -- 8.4.3. Image Formation -- 8.4.4. Partial Coherence -- 8.5. ADF-STEM Sample Calculations for Periodic Specimens -- 8.6. NonPeriodic Specimens -- 8.6.1. Fixed Beam Calculation -- 8.6.2. Scanned Beam Calculation -- 8.7. Program Display -- 8.8. Program Slicview -- A.1. CTEM -- A.2. STEM -- C.1. Atomic Charge Distribution -- C.2. X-ray Scattering Factors -- C.3. Electron Scattering Factors -- C.4. Parameterization.
Notes Description based on print version record.
Subject Electron microscopy -- Computer simulation.
SCIENCE -- Electron Microscopes & Microscopy.
Electronic books.
Electronic books.
ISBN 9781441965332
1441965335
9781441965325 (hbk.)
1441965327 (hbk.)