My Library

University LibraryCatalogue

For faster,
simpler
access.
Use Lean
Library.
Get it now
Don't show me again
     
Limit search to items available for borrowing or consultation
Result Page: Previous Next
Can't find that book? Try BONUS+
 
Look for full text

Search Discovery

Search CARM Centre Catalogue

Search Trove

Add record to RefWorks

Cover Art
E-RESOURCE
Author Ellis, Jonathan D. (Jonathan David)

Title Field guide to displacement measuring interferometry / Jonathan D. Ellis.

Published Bellingham, Washington : SPIE, [2014]

Copies

Location Call No. Status
 UniM INTERNET resource    AVAILABLE
Physical description 1 online resource (xvi, 128 pages).
Series SPIE field guides ; FG30
SPIE field guides ; FG30.
SPIE Digital Library.
Notes "SPIE Digital Library."--Website.
Bibliography Includes bibliographical references.
Contents Glossary of terms and acronyms -- Fundamentals of light and interference -- Basic interferometry systems -- Interferometry system characteristics -- Special interferometer configurations -- Interferometer alignment -- Mixing and periodic error -- Measurement errors and uncertainty -- Measurement uncertainty example -- Equation summary -- Bibliography.
Restrictions Restricted to subscribers or individual electronic text purchasers.
Summary This Field Guide provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilization for homodyne and heterodyne sources. The concept of displacement measurement uncertainty is discussed with a practical example of calculating uncertainty budgets. For practicing engineers, this Field Guide will serve as a refresher manual for error sources and uncertainty budgets. For researchers, it will bring new insight to the way in which this technology can be useful in their field. For new engineers, researchers, and students, it will also serve as an introduction into basic alignment techniques for breadboard-based optical systems.
Other formats Also available in print version.
System notes Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader.
Notes Title from PDF title page (SPIE eBooks Website, viewed 2014-01-09).
Other author Society of Photo-optical Instrumentation Engineers, publisher.
Subject Interferometry.
Optical measurements.
Electronic books.
Variant Title Displacement measuring interferometry.
ISBN 9780819498007
9780819497994
9780819498014
Standard Number 10.1117/3.1002328